MTE 481 - Analytical Methods for Materials
Crystallography, physics of X-rays, diffraction by crystalline materials, applications of X-ray, electron and neutron diffraction, and spectrometric analysis of materials. Writing proficiency is required for a passing grade in this course.
Prerequisite(s): MTE 373 or permission of instructor.
Prerequisite(s) with concurrency: MTE 373
Prerequisite(s): MTE 373 or permission of instructor.
Prerequisite(s) with concurrency: MTE 373
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mte_481_syllabus_-_f2011.pdf |
LECTURE NOTES
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00_-_objectives_outline_and_assessment.pdf |
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01_-_introduction_to_materials_characterization.pdf |
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02_-_principles_of_optical_microscopy.pdf |
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03_-_components_of_the_optical_microscope.pdf |
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04_-_metallography.pdf |
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05_-_imaging_modes_in_the_light_optical_microscope.pdf |
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06_-_production_and_properties_of_x-rays.pdf |
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07_-_crystal_geometry_and_crystallography.pdf |
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08_-_lattice_planes_and_directions.pdf |
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09_-_stereographic_projections.pdf |
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10_-_simple_crystal_structures.pdf |
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11_-_point_groups.pdf |
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12_-_space_groups.pdf |
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13_-_notation_for_crystal_structures.pdf |
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14_-_the_international_tables_for_crystallography.pdf |
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15_-_reciprocal_space.pdf |
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16_-_scattering_of_em_radiation.pdf |
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17_-_interactions_between_x-rays_and_matter.pdf |
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18_-_the_structure_factor_and_selection_rules.pdf |
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18_-_the_structure_factor_and_selection_rules.pdf |
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19_-_the_intensity_of_the_diffracted_x-rays.pdf |
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20_-_components_of_an_x-ray_diffractometer.pdf |
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21_-_electron_microscopy_and_chemical_analysis.pdf |
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22_-_technical_communication_via_writing.pdf |
LAB MODULES
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lab_1_-_crystal_structure_determination_for_cubic_crystals.pdf |
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lab_2_-_crystal_structure_determination_for_non-cubic_crystals.pdf |
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lab_3_-_precise_lattice_parameter_determination.pdf |
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lab_4_-_phase_diagram_determination.pdf |
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lab_5_-_crystal_size_and_lattice_strain__i.e._scherrer_analysis_.pdf |
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lab_6_-_residual_stress_analysis.pdf |
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lab_7_-_quantitative_analysis_of_phase_mixtures.pdf |
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lab_8_-_identificaiton_of_an_unknown_material.pdf |